The electron microscopy laboratories are equipped with line electron microscopes, which enable characterization of the structure of materials, fractographic analysis of fracture surfaces, their evaluation and analysis of the causes of production problems and optimization of production processes. In addition to high-resolution structural imaging using energy dispersive spectral microanalysis, point, area, line and X-ray maps of the distribution of elements in the material can be performed. The pressure in the working chamber can be selected in the microscopes and thus partially non-conductive samples can be studied without adjustments to the conductivity. Also, our laboratories allow EBSD analysis for more detailed material characterization.
The laboratory is also equipped with a scanning electron microscope for more detailed characterization of the structure of metallic and non-metallic materials. The high resolution capability allows the study of fine details of the structure, including the determination of the local chemical composition of crystallographic parameters of coexisting phases/microstructural components.
Instrumentation equipment:
- Scanning electron microscope JEOL 6490 LV equipped with Oxford Inca x-atc EDS analyzer - can be used for structural phase analysis of metallic and non-metallic materials, fractographic analysis, evaluation of material structure degradation, root cause analysis of manufacturing problems and optimization of manufacturing processes, EDS microanalysis (point, area and line analysis, X-ray elemental distribution maps)
- Scanning electron microscope QUANTA FEG 450 equipped with EDAX EDS analyzer and Hikari camera for EDAX EBSD analyses - can be used for structural phase analysis of metallic and non-metallic materials, fractographic analyses, evaluation of material structure degradation, root cause analysis of manufacturing problems and optimization of production processes, EDS microanalysis (point, area and line analysis, X-ray element distribution maps), EBSD analysis.
- Transmission electron microscope JEM-2100 - study of substructure of materials using extraction carbon replicas or thin films, phase analysis of materials using a combination of electron diffraction and X-ray microanalysis, determination of dislocation density, study of structure degradation processes depending on exposure parameters (effect of environment, temperature and loading conditions), possibility of preparation of thin films by electrolytic de-casting and ion sputtering.
Contact:
- Scanning electron microscope JEOL 6490 LV - Ing. Kateřina Konečná, Ph.D.
- Scanning electron microscope QUANTA FEG 450 - Ing. Anastasia Volodarskaja, Ph.D
- Transmission electron microscope JEM-2100 - prof. Ing. Vlastimil Vodárek, CSc.